=== START OF INFORMATION SECTION ===
Model Family: Seagate Momentus 5400.6
Device Model: ST9500325AS
Serial Number: 5VEA217N
LU WWN Device Id: 5 000c50 021c5170d
Firmware Version: 0006SDM2
User Capacity: 500.107.862.016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 1.5 Gb/s
Local Time is: Fri Mar 25 20:25:54 2016 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 139) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103b) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 115 078 006 Pre-fail Always - 84189041
3 Spin_Up_Time 0x0003 099 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2224
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 312447574
9 Power_On_Hours 0x0032 090 090 000 Old_age Always - 8941
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 020 Old_age Always - 2198
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 11405
188 Command_Timeout 0x0032 100 099 000 Old_age Always - 13
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 062 049 045 Old_age Always - 38 (Min/Max 18/41)
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 73
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 24
193 Load_Cycle_Count 0x0032 053 053 000 Old_age Always - 95854
194 Temperature_Celsius 0x0022 038 051 000 Old_age Always - 38 (0 10 0 0 0)
195 Hardware_ECC_Recovered 0x001a 051 045 000 Old_age Always - 84189041
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 47
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 47
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 11742 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 11742 occurred at disk power-on lifetime: 8937 hours (372 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 ff ff ff 4f 00 04:12:31.779 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 04:12:31.778 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 00 04:12:31.776 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 04:12:31.776 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 00 04:12:31.744 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
Error 11741 occurred at disk power-on lifetime: 8937 hours (372 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 ff ff ff 4f 00 04:12:29.452 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 04:12:29.444 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 04:12:29.423 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 04:12:29.423 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 00 04:12:29.421 IDENTIFY DEVICE
Error 11740 occurred at disk power-on lifetime: 8937 hours (372 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 ff ff ff 4f 00 04:12:27.048 READ FPDMA QUEUED
61 00 28 ff ff ff 4f 00 04:12:27.048 WRITE FPDMA QUEUED
61 00 08 ff ff ff 4f 00 04:12:27.048 WRITE FPDMA QUEUED
61 00 08 ff ff ff 4f 00 04:12:27.047 WRITE FPDMA QUEUED
61 00 08 ff ff ff 4f 00 04:12:27.047 WRITE FPDMA QUEUED
Error 11739 occurred at disk power-on lifetime: 8937 hours (372 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: WP at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 00 18 ff ff ff 4f 00 04:12:24.517 WRITE FPDMA QUEUED
61 00 10 ff ff ff 4f 00 04:12:24.517 WRITE FPDMA QUEUED
61 00 08 ff ff ff 4f 00 04:12:24.516 WRITE FPDMA QUEUED
61 00 08 ff ff ff 4f 00 04:12:24.516 WRITE FPDMA QUEUED
61 00 20 ff ff ff 4f 00 04:12:24.516 WRITE FPDMA QUEUED
Error 11738 occurred at disk power-on lifetime: 8937 hours (372 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 ff ff ff 4f 00 04:12:22.108 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 04:12:22.099 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 04:12:22.078 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 04:12:22.063 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 04:12:22.038 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.