smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-31-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint S250
Device Model: SAMSUNG HD250HJ
Serial Number: S0URJ9BQ205139
LU WWN Device Id: 5 0000f0 09b205139
Firmware Version: FH100-06
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3b
Local Time is: Fri Oct 12 16:17:11 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3664) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 62) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 1
3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 4416
4 Start_Stop_Count 0x0032 096 096 000 Old_age Always - 4999
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4603
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2634
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 13824569
184 End-to-End_Error 0x0033 253 253 099 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 253 253 000 Old_age Always - 0
188 Command_Timeout 0x0032 253 253 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 151 106 000 Old_age Always - 29 (Min/Max 8/44)
194 Temperature_Celsius 0x0022 151 103 000 Old_age Always - 29 (Min/Max 8/45)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 13824569
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 Data_Address_Mark_Errs 0x0032 100 100 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 5
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5 occurred at disk power-on lifetime: 4237 hours (176 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 00 00 00 00 a0 00 00:58:15.125 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 00:58:15.000 NOP [Abort queued commands]
ec 00 00 00 00 00 a0 00 00:28:13.438 IDENTIFY DEVICE
b0 d8 01 01 4f c2 e0 00 00:28:13.375 SMART ENABLE OPERATIONS
b0 d0 00 00 4f c2 e0 00 00:26:09.000 SMART READ DATA
Error 4 occurred at disk power-on lifetime: 4235 hours (176 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 00 00 00 00 00 00 01:29:12.063 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 01:29:12.063 NOP [Abort queued commands]
00 00 01 01 00 00 a0 00 01:29:02.875 NOP [Abort queued commands]
00 00 01 01 00 00 a0 00 01:29:02.375 NOP [Abort queued commands]
00 00 01 01 00 00 a0 00 01:29:02.000 NOP [Abort queued commands]
Error 3 occurred at disk power-on lifetime: 4235 hours (176 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 00 00 00 00 a0 00 01:29:01.063 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 01:29:01.000 NOP [Abort queued commands]
00 00 01 01 00 00 a0 00 01:29:00.500 NOP [Abort queued commands]
00 00 01 01 00 00 a0 00 01:29:00.000 NOP [Abort queued commands]
00 00 01 01 00 00 a0 00 01:28:59.938 NOP [Abort queued commands]
Error 2 occurred at disk power-on lifetime: 4229 hours (176 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 00 00 00 00 a0 00 00:30:15.875 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 00:30:15.813 NOP [Abort queued commands]
ef 90 03 00 00 00 00 00 00:25:58.313 SET FEATURES [Reserved for Serial ATA]
ef 02 00 00 00 00 00 00 00:25:58.313 SET FEATURES [Enable write cache]
ec 00 00 00 00 00 a0 00 00:25:58.250 IDENTIFY DEVICE
Error 1 occurred at disk power-on lifetime: 4198 hours (174 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 00 00 00 00 a0 00 00:20:22.563 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 00:20:22.563 NOP [Abort queued commands]
ec 00 00 00 00 00 a0 00 00:03:25.313 IDENTIFY DEVICE
b0 d8 01 01 4f c2 e0 00 00:03:25.250 SMART ENABLE OPERATIONS
b0 d0 00 00 4f c2 e0 00 00:01:48.750 SMART READ DATA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.