sudo smartctl -a -d sat /dev/sdb
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.15.0-76-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: WDC WD80EZZX-11CSGA0
Serial Number:
LU WWN Device Id: 5 000cca 260da0250
Firmware Version: 83.H0A03
User Capacity: 8.001.563.222.016 bytes [8,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 3.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 11 09:52:01 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 101) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1359) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 131 131 054 Pre-fail Offline - 116
3 Spin_Up_Time 0x0007 217 217 024 Pre-fail Always - 245 (Average 362)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 103
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 128 128 020 Pre-fail Offline - 18
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 25628
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 101
22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1086
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 1086
194 Temperature_Celsius 0x0002 139 139 000 Old_age Always - 43 (Min/Max 18/52)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 16
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 25585 hours (1066 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 28 6d f1 40 Error: UNC 48 sectors at LBA = 0x00f16d28 = 15822120
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 30 28 6d f1 40 00 00:27:16.931 READ DMA EXT
25 00 30 28 6d f1 40 04 00:27:16.931 READ DMA EXT
25 00 08 28 6c f1 40 00 00:27:14.101 READ DMA EXT
25 00 08 08 90 f1 40 00 00:27:13.906 READ DMA EXT
25 00 08 00 90 f1 40 00 00:27:13.878 READ DMA EXT
Error 2 occurred at disk power-on lifetime: 25584 hours (1066 days + 0 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 20 df 45 49 40 Error: ICRC, ABRT 32 sectors at LBA = 0x004945df = 4802015
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 80 45 49 40 00 1d+12:21:51.048 READ DMA EXT
25 00 80 00 45 49 40 00 1d+12:21:51.045 READ DMA EXT
25 00 80 80 44 49 40 00 1d+12:21:51.043 READ DMA EXT
25 00 80 00 44 49 40 00 1d+12:21:51.041 READ DMA EXT
25 00 80 80 43 49 40 00 1d+12:21:51.039 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 25546 hours (1064 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 43 00 00 00 00 00 Error: UNC at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 28 c0 87 f1 40 08 00:08:11.438 READ FPDMA QUEUED
60 00 20 60 b2 dc 40 08 00:08:08.661 READ FPDMA QUEUED
60 00 18 b0 62 64 40 08 00:08:08.660 READ FPDMA QUEUED
60 10 10 30 19 44 40 08 00:08:08.658 READ FPDMA QUEUED
60 08 08 20 60 47 40 08 00:08:08.650 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 25626 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.